>1000X · Single-lens

Nano-Resolution Semiconductor Wafer Afm Microscope

>1000X · Single-lens

Ls-Afm Atomic Force Microscope System for Semiconductor Wafer Scanning

>1000X · Single-lens

FM-Nanoview Tapping Teaching Atomic Force Microscope

>1000X · Single-lens

Atomic Force Microscope for Wafer Industry Type

>1000X · Single-lens

Atomic Force Microscopy for Semiconductor

Automatic High Precision CNC 3D Coordinate Measuring Machine (CMM-584C)

Ordinary Light · Electronic

Scanning Acoustic Microscopy Ultrasonic Detection of Internal Defects in Chip

Teaching · Electronic

Ultrasonic Scanning Acoustic Microscopy for Semiconductor Devices and Materials

90%-95% · ISO9001

Objective 195 Achromatic Lens for Microscopes